Indian Journal of Agricultural Research

  • Chief EditorT. Mohapatra

  • Print ISSN 0367-8245

  • Online ISSN 0976-058X

  • NAAS Rating 5.20

  • SJR 0.293

Frequency :
Bi-monthly (February, April, June, August, October and December)
Indexing Services :
BIOSIS Preview, ISI Citation Index, Biological Abstracts, Elsevier (Scopus and Embase), AGRICOLA, Google Scholar, CrossRef, CAB Abstracting Journals, Chemical Abstracts, Indian Science Abstracts, EBSCO Indexing Services, Index Copernicus
Indian Journal of Agricultural Research, volume 38 issue 4 (december 2004) : 235 - 242


D.K. Mishra, D. Roy
1Department of Genetics Clnd Plant Breeding, G.B. Pant University of Agriculture and Technology, Pantnagar - 263 145, India
  • Submitted|

  • First Online |

  • doi

Cite article:- Mishra D.K., Roy D. (2023). STUDY OF ASSOCIATION BETWEEN TRAITS IN FULL-SIB AND HALF-SIB FAMILIES OF SUNFLOWER (H. ANNUUS L.). Indian Journal of Agricultural Research. 38(4): 235 - 242. doi: .
Four characters, namely plant height, head diameter, leaf length and leaf widths showed similar pattern of association in different samples of parental base population. The full-sib and half-sib families populations showed different pattern of association between traits. Some associations between traits such as leaf length and leaf width and between number of leaves/plant and plant height in half-Sib families population and between leaf length and leaf width, plant height and head diameter in full-sib families population remain unchanged whereas some other correlations such as between 100-seed weight and leaf width disappeared in half-sib as well as full-sib populations. Some new correlations such as seed yield/plant and head diameter and days to first flowering and days to maturity appeared in the full-sib and half-sib progeny populations.
    1. Falconer, D.S. (1960). Introduction to Quantitative Genetics. Oliver and Boyd, Edinburgh.
    2. Mather, K. and Jinks, J.L. (1971). Biometrical Genetics. Chapman and Hall, London.
    3. Searle, S.R. (1961). Biometrics, 17: 474-480.

    Editorial Board

    View all (0)