Analysis of variance (ANOVA) is an important tool to determine the variability present among the genotypes. The analysis (ANOVA) revealed the presence of considerable variability among 280 genotypes including checks (JG-11 and SA-1) for all the five polygenic traits (Table 1). The results show ample scope incorporating the promising genotypes in the breeding programmes aimed improvement in seed yield and its component characters.
Group constellations by tocher method
On the basis of D
2 values, two-hundred and eighty genotypes including two checks (JG-11 and SA-1) were clustered into 17 clusters based on Tocher’s method (
Rao, 1952). Out of 17 clusters, Cluster II has the highest number of genotypes (89) followed by cluster I with 83 genotypes, cluster III with 31 genotypes, cluster VIII with 29 genotypes, cluster VI with 24 genotypes, cluster VII with 15 genotypes (Table 2 and Fig 1). Whereas, the remaining clusters IV, V, IX, X, XI, XII, XIII, XIV, XV, XVI, XVII are mono-genotypic containing one genotype each, which shows that the genotypes included in these clusters are more divergent than the genotypes belonging to other clusters. The results are in accordance with the results obtained by
Gediya et al., (2018), Bohare et al., (2020). The solitary clusters are obtained due to the fact that they exhibit some distinctive characters which make them diverse from the other clusters.
Relative contribution of each character towards genetic divergence
The analysi revealed that, days to maturity had contributed maximum towards divergence (29.92%) followed by 100 seed-weight (28.02%), plant height (22.45%), days to 50 per cent flowering (18.67%). Whereas,least contribution was made by seed yield/plant (0.57%) towards the genetic divergence (Fig 2).
Intra-cluster and inter-cluster distances among the chickpea germplasm
Intra-cluster and inter-cluster distances were calculated using D
2 values. Out of 17 clusters, intra cluster distances were lower than inter-cluster distances indicating that genotypes included in different clusters are more diverse compared to the genotypes included in the same clusters. The mean intra-cluster D
2 values were ranged from 0 to 425.66. Cluster VII logged highest intra-cluster distance (425.66), followed by cluster VIII (401.40), indicating that wide genetic divergence was existing among the genotypes within these clusters. So, more emphasis will be given to the genotypes included in these clusters while selecting parents for future crop improvement. The clusters
viz., cluster VI (260.71), cluster III (221.62), cluster II (176.78), cluster I (148.70) had moderate intra cluster distance. Whereas, no intra cluster distance was observed in nine clusters IV, V, IX, X, XI, XII, XIII, XIV, XV, XVI, XVII as they are mono-genotypic with one genotype per cluster (Table 3).
Cluster mean values of seventeen clusters
Cluster mean value ranged from 31 days (cluster XIV) to 83 days (cluster XVI) for the trait days to 50 per cent flowering. Cluster XIV genotypes exhibited early flowering habit with average number of days taken to flowering were 31, indicating that the Cluster XIV composed of early flowering genotypes. Cluster mean for the trait days to maturity ranged from 90 (cluster XI) to 130 days (cluster XVI). The genotypes of Cluster XI demonstrated a unique early maturing behaviour, taking only 90 days to reach maturity. In terms of plant height, genotypes from cluster IX displayed the greatest cluster mean value (66 cm), indicating that they were taller than genotypes from other clusters. Cluster VI had the lowest cluster mean value (34.03 cm) indicating that the genotypes included in this cluster are dwarf. Cluster mean value for 100 seed-weight was ranged from 8 g (cluster XI) to 56.8 g (cluster XVII), the genotypes of the cluster XVII showed the highest 100 seed-weight followed by cluster III (31.7 g) which shows that the genotypes of this cluster have bold seed characters which are preferred by the consumers. The genotype MNK-1 (56.80 g) showed the highest 100 seed-weight and the genotype ICC-14077 (4.8 g) has the lowest 100 seed-weight. Cluster mean for seed yield/plant values ranged from 2.38 g (cluster XII) to 8.13 g (cluster XVII), with genotypes from cluster XVII had the highest seed yield/plant (8.13 g) suggesting that the genotypes of this cluster are preferred for the seed yield improvement of chickpea (Table 4).
Fusarium wilt screaning in chickpea (Cicer arietinum L.) germplasm
Among the two hundred and eighty-two chickpea genotypes along with two checks screened against wilt, there was a significant variation between genotypes for their disease reaction. Out of 280 germplasm screened, 30 showed resistant (10.71%), 83 moderately resistant (29.64%), 44 moderately susceptible (15.71%), 31 susceptible (11.07%) and 92 highly susceptible reaction to fusarium wilt. The per cent disease incidence (PDI) ranged from 0.44 (ICCV 16116) to 49.49 (ICCV-171101) among germplasm with resistance check WR-315 and susceptible check JG-62 recording the wilt incidence of 4.25 and 86.42 per cent respectively. The lowest PDI was observed for the line ICCV 16116 (0.44) followed by ICC 9942 (1.77), ICC 4657 (3.48) and ICC 9872 (5.50) and can be re-validate and used in fusarium wilt resistance breeding program (Table 5). Similar study was conducted by
Ayyub et al., (2003) who reported high level of resistance to
Fusarium wilt in chickpea germplasm originating from different sources.
Bakhsh et al., (2007) reported 3 genotypes with disease incidence 0, 6.7 and 8.3 per cent as resistant and 4 with disease incidence of 18.2 to 20 per cent as tolerant
Kumar et al., (2013) reported that out of 100 genotypes, 44 showed resistant reaction, 11 MR, 22 tolerant, 15 moderately susceptible and 8 susceptible to
Fusarium wilt. Similar results were also reported by
Shah et al., (2015) and
Kumar et al., (2015), Ayana et al., (2019). Laxuman et al., (2022) used various wilt resistant chickpea genotypes and breeding lines for evaluating yield response in different environments. They observed higher average yields of KCD-11 and ICCV 191106 with wilt resistance.